The experts in
vertical , cantilever
and MEMS probe cards
Probe Technology Ltd.
Integrated Technology Corporation (ITC)
Tel: +44 (0)1355 221228 Fax: +44 (0)1355 234855 e-mail: sales@probetechnology.co.uk
The PB1200 is an automated system that has the capability to fully test alignment, planarity and (optionally) gram force but its main purpose is in probe card repair.
This benchtop instrument uses simple probe card holders rather than expensive motherboards.
The probe card is tested and repaired in the tips up position. Repair and retest of individual probes is easily performed. After repair each individual probe may be retested for alignment and planarity.
PB1200 probe card analyser
PB3600 probe card analyser
The PB3600 is an ergonomic, easy to use instrument with the greatest measurement resolution, highest throughput and most flexibility. It provides the latest techniques in testing and maintaining probe cards.
Features include automated probe card flip fixture, expandable RID MUX system, Windows operating system, manual microscope drive, ergonomic microscope with integrated video system for probe adjustment, measurement chuck with sapphire camera window, gram force measurement and many others.
Tests performed include leakage, alignment, planarity, contact resistance, gram force, wire check and many more.
The PB6800 offers a 12” diameter measurement chuck for 300mm arrays. This enables the entire array to be supported on the chuck during test.
A double relay MUX system allows for an increased channel count up to a total of 12,032 (3,072 supplied as standard)
Other advantages include:
- high volume production throughput
- excellent electrical measurement capability
- ability to drive relays on any channel
- best tool for probe cards with complex circuits and relays on the PCB
- lift force of 300Kg makes it ideal for vertical probe cards
- lightweight, easy to install motherboards
Tests performed include leakage, alignment, planarity, contact resistance, gram force, wire check and many more.
ProbeTracker™ top side camera option provides a simple automatic visual reference for probe position adjustment. Auto locate function pinpoints the exact location of each probe. The ProbeTracker™ will automatically move the microscope to a position over a probe which, after alignment, has been identified as needing to be adjusted. It is idea for "tips up" repairs.
PB6800 probe card analyser
ITC55100 UIS Tester (shown with 55140 and MTS)
The ITC55100 is a high current inductive load tester. It performs ruggedness testing of power semiconductor devices and has the added capability of testing dual devices; N-channel, P-channel or combination.
Tests performed include continuity, functional device and avalanche.
Features include dual device test capability, solid state switching (no relays), 4 port MUX control interface, advanced handler control interface, touchscreen user interface
The ITC59100 is a production test system for gate charge (Qg) and gate resistance (Rg). The base system has the provision for up to four test and measurement units that perform transient measurements on semiconductor devices.
Four independently programmable handler interfaces. Embedded microprocessor running Windows XP. Front panel colour touch screen display for all user inputs and results display. Provides data logging and statistical information.
ITC59100 Rg/Qg Tester
Power Semiconductor Test Equipment
Probe Card Analysers